Yield optimization by design centering & worst-case distance analysis
Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
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Main Authors: | Samudra, G.S., Chen, H.M., Chan, D.S.H., Ibrahim, Yaacob |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81368 |
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Institution: | National University of Singapore |
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