A golden block self-generating scheme for continuous patterned wafer inspections
10.1109/ICIAP.1999.797634
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sg-nus-scholar.10635-813722015-01-15T23:28:44Z A golden block self-generating scheme for continuous patterned wafer inspections Guan, S.-U. Xie, P. ELECTRICAL ENGINEERING 10.1109/ICIAP.1999.797634 Proceedings - International Conference on Image Analysis and Processing, ICIAP 1999 436-443 2014-10-07T03:07:36Z 2014-10-07T03:07:36Z 1999 Conference Paper Guan, S.-U.,Xie, P. (1999). A golden block self-generating scheme for continuous patterned wafer inspections. Proceedings - International Conference on Image Analysis and Processing, ICIAP 1999 : 436-443. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/ICIAP.1999.797634" target="_blank">https://doi.org/10.1109/ICIAP.1999.797634</a> 0769500404 http://scholarbank.nus.edu.sg/handle/10635/81372 NOT_IN_WOS Scopus |
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10.1109/ICIAP.1999.797634 |
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ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING Guan, S.-U. Xie, P. |
format |
Conference or Workshop Item |
author |
Guan, S.-U. Xie, P. |
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Guan, S.-U. Xie, P. A golden block self-generating scheme for continuous patterned wafer inspections |
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Guan, S.-U. |
title |
A golden block self-generating scheme for continuous patterned wafer inspections |
title_short |
A golden block self-generating scheme for continuous patterned wafer inspections |
title_full |
A golden block self-generating scheme for continuous patterned wafer inspections |
title_fullStr |
A golden block self-generating scheme for continuous patterned wafer inspections |
title_full_unstemmed |
A golden block self-generating scheme for continuous patterned wafer inspections |
title_sort |
golden block self-generating scheme for continuous patterned wafer inspections |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/81372 |
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1681089059246571520 |