ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.

Conference Record - International Conference on Communications

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Main Authors:	Lye, K.M., Tjhung, T.T.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81628
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81628
record_format	dspace
spelling	sg-nus-scholar.10635-816282015-03-08T00:06:22Z ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES. Lye, K.M. Tjhung, T.T. ELECTRICAL ENGINEERING Conference Record - International Conference on Communications 1587-1591 CICCD 2014-10-07T03:10:20Z 2014-10-07T03:10:20Z 1986 Conference Paper Lye, K.M.,Tjhung, T.T. (1986). ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.. Conference Record - International Conference on Communications : 1587-1591. ScholarBank@NUS Repository. 05361486 http://scholarbank.nus.edu.sg/handle/10635/81628 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Conference Record - International Conference on Communications
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Lye, K.M. Tjhung, T.T.
format	Conference or Workshop Item
author	Lye, K.M. Tjhung, T.T.
spellingShingle	Lye, K.M. Tjhung, T.T. ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.
author_sort	Lye, K.M.
title	ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.
title_short	ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.
title_full	ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.
title_fullStr	ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.
title_full_unstemmed	ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.
title_sort	on quaternary dpsk error rates due to noise and interferences.
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81628
_version_	1681089105906106368

ON QUATERNARY DPSK ERROR RATES DUE TO NOISE AND INTERFERENCES.

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