Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading

Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading

10.1109/26.701304

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Bibliographic Details
Main Authors: Kam, P.Y., Zhong, C.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Bit-error probability
Differential phase-shift keying
Rician channels
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62881
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/62881

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