Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading

10.1109/26.701304

Saved in:
Bibliographic Details
Main Authors: Kam, P.Y., Zhong, C.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62881
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-62881
record_format dspace
spelling sg-nus-scholar.10635-628812015-02-16T17:59:32Z Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading Kam, P.Y. Zhong, C. ELECTRICAL ENGINEERING Bit-error probability Differential phase-shift keying Rician channels 10.1109/26.701304 IEEE Transactions on Communications 46 7 860-862 IECMB 2014-06-17T06:55:54Z 2014-06-17T06:55:54Z 1998 Article Kam, P.Y.,Zhong, C. (1998). Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading. IEEE Transactions on Communications 46 (7) : 860-862. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/26.701304" target="_blank">https://doi.org/10.1109/26.701304</a> 00906778 http://scholarbank.nus.edu.sg/handle/10635/62881 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
topic Bit-error probability
Differential phase-shift keying
Rician channels
spellingShingle Bit-error probability
Differential phase-shift keying
Rician channels
Kam, P.Y.
Zhong, C.
Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading
description 10.1109/26.701304
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Kam, P.Y.
Zhong, C.
format Article
author Kam, P.Y.
Zhong, C.
author_sort Kam, P.Y.
title Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading
title_short Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading
title_full Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading
title_fullStr Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading
title_full_unstemmed Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading
title_sort tight bounds on the bit-error probabilities of 2dpsk and 4dpsk in nonselective rician fading
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/62881
_version_ 1681085856918536192