Tight bounds on the bit-error probabilities of 2DPSK and 4DPSK in nonselective rician fading
10.1109/26.701304
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Main Authors: | Kam, P.Y., Zhong, C. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62881 |
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Institution: | National University of Singapore |
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