Reliability by design a tool to reduce time-to-market
IEEE International Engineering Management Conference
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sg-nus-scholar.10635-817132015-01-11T21:17:05Z Reliability by design a tool to reduce time-to-market Foo, S.W. Lien, W.L. Xie, M. van Geest, E. ELECTRICAL ENGINEERING INDUSTRIAL & SYSTEMS ENGINEERING IEEE International Engineering Management Conference 251-256 IEMCF 2014-10-07T03:11:14Z 2014-10-07T03:11:14Z 1995 Conference Paper Foo, S.W.,Lien, W.L.,Xie, M.,van Geest, E. (1995). Reliability by design a tool to reduce time-to-market. IEEE International Engineering Management Conference : 251-256. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81713 NOT_IN_WOS Scopus |
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IEEE International Engineering Management Conference |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Foo, S.W. Lien, W.L. Xie, M. van Geest, E. |
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Conference or Workshop Item |
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Foo, S.W. Lien, W.L. Xie, M. van Geest, E. |
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Foo, S.W. Lien, W.L. Xie, M. van Geest, E. Reliability by design a tool to reduce time-to-market |
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Foo, S.W. |
title |
Reliability by design a tool to reduce time-to-market |
title_short |
Reliability by design a tool to reduce time-to-market |
title_full |
Reliability by design a tool to reduce time-to-market |
title_fullStr |
Reliability by design a tool to reduce time-to-market |
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Reliability by design a tool to reduce time-to-market |
title_sort |
reliability by design a tool to reduce time-to-market |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/81713 |
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