Reliability by design a tool to reduce time-to-market

IEEE International Engineering Management Conference

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Bibliographic Details
Main Authors: Foo, S.W., Lien, W.L., Xie, M., van Geest, E.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81713
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Institution: National University of Singapore
id sg-nus-scholar.10635-81713
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spelling sg-nus-scholar.10635-817132015-01-11T21:17:05Z Reliability by design a tool to reduce time-to-market Foo, S.W. Lien, W.L. Xie, M. van Geest, E. ELECTRICAL ENGINEERING INDUSTRIAL & SYSTEMS ENGINEERING IEEE International Engineering Management Conference 251-256 IEMCF 2014-10-07T03:11:14Z 2014-10-07T03:11:14Z 1995 Conference Paper Foo, S.W.,Lien, W.L.,Xie, M.,van Geest, E. (1995). Reliability by design a tool to reduce time-to-market. IEEE International Engineering Management Conference : 251-256. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81713 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description IEEE International Engineering Management Conference
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Foo, S.W.
Lien, W.L.
Xie, M.
van Geest, E.
format Conference or Workshop Item
author Foo, S.W.
Lien, W.L.
Xie, M.
van Geest, E.
spellingShingle Foo, S.W.
Lien, W.L.
Xie, M.
van Geest, E.
Reliability by design a tool to reduce time-to-market
author_sort Foo, S.W.
title Reliability by design a tool to reduce time-to-market
title_short Reliability by design a tool to reduce time-to-market
title_full Reliability by design a tool to reduce time-to-market
title_fullStr Reliability by design a tool to reduce time-to-market
title_full_unstemmed Reliability by design a tool to reduce time-to-market
title_sort reliability by design a tool to reduce time-to-market
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/81713
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