Reliability by design a tool to reduce time-to-market

IEEE International Engineering Management Conference

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Bibliographic Details
Main Authors: Foo, S.W., Lien, W.L., Xie, M., van Geest, E.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81713
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Institution: National University of Singapore