Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Saved in:
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Conference or Workshop Item |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81737 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-81737 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-817372015-01-07T14:20:01Z Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing Oh, G.G. Chim, W.K. Chan, D.S.H. Lou, C.L. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 99-103 234 2014-10-07T03:11:29Z 2014-10-07T03:11:29Z 1999 Conference Paper Oh, G.G.,Chim, W.K.,Chan, D.S.H.,Lou, C.L. (1999). Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 99-103. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/81737 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Oh, G.G. Chim, W.K. Chan, D.S.H. Lou, C.L. |
| format |
Conference or Workshop Item |
| author |
Oh, G.G. Chim, W.K. Chan, D.S.H. Lou, C.L. |
| spellingShingle |
Oh, G.G. Chim, W.K. Chan, D.S.H. Lou, C.L. Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing |
| author_sort |
Oh, G.G. |
| title |
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing |
| title_short |
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing |
| title_full |
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing |
| title_fullStr |
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing |
| title_full_unstemmed |
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing |
| title_sort |
series resistance and effective channel mobility degradation in ldd nmosfets under hot-carrier stressing |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/81737 |
| _version_ |
1681089125653938176 |