Study of traps in semi-insulating III-V epitaxial films by zero bias transient current spectroscopy

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors: Lau, W.S., Goo, C.H., Chong, T.C., Tan, C.T.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81770
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Institution: National University of Singapore
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Summary:Materials Research Society Symposium - Proceedings