A facile approach for screening isolated nanomagnetic behavior for bit-patterned media

10.1088/0957-4484/25/22/225203

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Bibliographic Details
Main Authors:	Thiyagarajah, N., Asbahi, M., Wong, R.T.J., Low, K.W.M., Yakovlev, N.L., Yang, J.K.W., Ng, V.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	bit pattern media exchange interaction magnetic force microscopy magneto-optical Kerr effect
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81866
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Institution:	National University of Singapore

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