Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts

Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts

10.1063/1.3684617

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Bibliographic Details
Main Authors: Wu, Y., Wang, Y., Wang, J., Zhou, M., Zhang, A., Zhang, C., Yang, Y., Hua, Y., Xu, B.
Other Authors: DATA STORAGE INSTITUTE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82252
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/82252

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