Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts

• Main Authors: Wu, Y., Wang, Y., Wang, J., Zhou, M., Zhang, A., Zhang, C., Yang, Y., Hua, Y., Xu, B.
• Other Authors: DATA STORAGE INSTITUTE
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/82252
• Institution: National University of Singapore

10.1063/1.3684617