Exchange bias between NiFe and IrMn/Ru superlattices

10.1016/j.ssc.2008.04.027

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Bibliographic Details
Main Authors: Guo, Z.B., Wu, Y.H., Han, G.C., Qiu, J.J., Liu, B., Chantrell, R.W.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82314
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Institution: National University of Singapore
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Summary:10.1016/j.ssc.2008.04.027