Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices

Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices

10.1063/1.4768944

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Bibliographic Details
Main Authors: Thiyagarajah, N., Lin, L., Bae, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82339
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Institution: National University of Singapore
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Summary:10.1063/1.4768944

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