Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices

10.1063/1.4768944

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Main Authors: Thiyagarajah, N., Lin, L., Bae, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82339
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-823392024-11-10T00:24:25Z Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices Thiyagarajah, N. Lin, L. Bae, S. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.4768944 Applied Physics Letters 101 22 - APPLA 2014-10-07T04:28:12Z 2014-10-07T04:28:12Z 2012-11-26 Article Thiyagarajah, N., Lin, L., Bae, S. (2012-11-26). Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices. Applied Physics Letters 101 (22) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4768944 00036951 http://scholarbank.nus.edu.sg/handle/10635/82339 000311967000055 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.4768944
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Thiyagarajah, N.
Lin, L.
Bae, S.
format Article
author Thiyagarajah, N.
Lin, L.
Bae, S.
spellingShingle Thiyagarajah, N.
Lin, L.
Bae, S.
Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices
author_sort Thiyagarajah, N.
title Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices
title_short Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices
title_full Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices
title_fullStr Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices
title_full_unstemmed Fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices
title_sort fabrication of single-dot planar nano-devices and the application to the exchange bias characterization in nano-pillar devices
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82339
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