Graphene thickness determination using reflection and contrast spectroscopy
10.1021/nl071254m
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2014
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sg-nus-scholar.10635-824262023-10-26T21:24:59Z Graphene thickness determination using reflection and contrast spectroscopy Ni, Z.H. Wang, H.M. Kasim, J. Fan, H.M. Yu, T. Wu, Y.H. Feng, Y.P. Shen, Z.X. PHYSICS ELECTRICAL & COMPUTER ENGINEERING 10.1021/nl071254m Nano Letters 7 9 2758-2763 2014-10-07T04:29:15Z 2014-10-07T04:29:15Z 2007-09 Article Ni, Z.H., Wang, H.M., Kasim, J., Fan, H.M., Yu, T., Wu, Y.H., Feng, Y.P., Shen, Z.X. (2007-09). Graphene thickness determination using reflection and contrast spectroscopy. Nano Letters 7 (9) : 2758-2763. ScholarBank@NUS Repository. https://doi.org/10.1021/nl071254m 15306984 http://scholarbank.nus.edu.sg/handle/10635/82426 000249501900039 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
10.1021/nl071254m |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Ni, Z.H. Wang, H.M. Kasim, J. Fan, H.M. Yu, T. Wu, Y.H. Feng, Y.P. Shen, Z.X. |
| format |
Article |
| author |
Ni, Z.H. Wang, H.M. Kasim, J. Fan, H.M. Yu, T. Wu, Y.H. Feng, Y.P. Shen, Z.X. |
| spellingShingle |
Ni, Z.H. Wang, H.M. Kasim, J. Fan, H.M. Yu, T. Wu, Y.H. Feng, Y.P. Shen, Z.X. Graphene thickness determination using reflection and contrast spectroscopy |
| author_sort |
Ni, Z.H. |
| title |
Graphene thickness determination using reflection and contrast spectroscopy |
| title_short |
Graphene thickness determination using reflection and contrast spectroscopy |
| title_full |
Graphene thickness determination using reflection and contrast spectroscopy |
| title_fullStr |
Graphene thickness determination using reflection and contrast spectroscopy |
| title_full_unstemmed |
Graphene thickness determination using reflection and contrast spectroscopy |
| title_sort |
graphene thickness determination using reflection and contrast spectroscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/82426 |
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1781784134273728512 |