Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films
10.1063/1.1667602
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sg-nus-scholar.10635-825822023-10-25T22:05:50Z Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films Feng, W. Choi, W.K. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1667602 Journal of Applied Physics 95 8 4197-4203 JAPIA 2014-10-07T04:31:04Z 2014-10-07T04:31:04Z 2004-04-15 Article Feng, W., Choi, W.K. (2004-04-15). Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films. Journal of Applied Physics 95 (8) : 4197-4203. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1667602 00218979 http://scholarbank.nus.edu.sg/handle/10635/82582 000220586100047 Scopus |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Feng, W. Choi, W.K. |
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Feng, W. Choi, W.K. |
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Feng, W. Choi, W.K. Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films |
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Feng, W. |
title |
Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films |
title_short |
Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films |
title_full |
Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films |
title_fullStr |
Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films |
title_full_unstemmed |
Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films |
title_sort |
investigation of thermal effect on electrical properties of si 0.887ge0.113 and si0.887-yge 0.113cy films |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/82582 |
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