Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films

10.1063/1.1667602

Saved in:
Bibliographic Details
Main Authors: Feng, W., Choi, W.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82582
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-82582
record_format dspace
spelling sg-nus-scholar.10635-825822023-10-25T22:05:50Z Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films Feng, W. Choi, W.K. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1667602 Journal of Applied Physics 95 8 4197-4203 JAPIA 2014-10-07T04:31:04Z 2014-10-07T04:31:04Z 2004-04-15 Article Feng, W., Choi, W.K. (2004-04-15). Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films. Journal of Applied Physics 95 (8) : 4197-4203. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1667602 00218979 http://scholarbank.nus.edu.sg/handle/10635/82582 000220586100047 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1667602
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Feng, W.
Choi, W.K.
format Article
author Feng, W.
Choi, W.K.
spellingShingle Feng, W.
Choi, W.K.
Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films
author_sort Feng, W.
title Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films
title_short Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films
title_full Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films
title_fullStr Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films
title_full_unstemmed Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy films
title_sort investigation of thermal effect on electrical properties of si 0.887ge0.113 and si0.887-yge 0.113cy films
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82582
_version_ 1781784175635857408