Stress tuning of Ge nanocrystals embedded in dielectrics

10.1021/jp801529j

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Bibliographic Details
Main Authors: Zheng, F., Choi, W.K., Lin, F., Tripathy, S., Zhang, J.X.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83089
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Institution: National University of Singapore
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Summary:10.1021/jp801529j