Stress tuning of Ge nanocrystals embedded in dielectrics

Stress tuning of Ge nanocrystals embedded in dielectrics

10.1021/jp801529j

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Bibliographic Details
Main Authors:	Zheng, F., Choi, W.K., Lin, F., Tripathy, S., Zhang, J.X.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83089
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Institution:	National University of Singapore

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