Temperature-dependent phase separation during annealing of Ge 2Sb 2Te 5 thin films in vacuum

Temperature-dependent phase separation during annealing of Ge 2Sb 2Te 5 thin films in vacuum

10.1016/j.apsusc.2012.03.005

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書目詳細資料
Main Authors: Zhang, Z., Pan, J., Fang, L.W.-W., Yeo, Y.-C., Foo, Y.L., Zhao, R., Shi, L., Tok, E.S.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Article
出版: 2014
主題:
Ge 2Sb 2Te 5
Phase separation
X-ray photoelectron spectroscopy
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/83153
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機構: National University of Singapore
實物特徵
總結:10.1016/j.apsusc.2012.03.005

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