A tunable and program-erasable capacitor on Si with excellent tuning memory

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers

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Bibliographic Details
Main Authors: Lai, C.H., Lee, C.F., Chin, A., Zhu, C., Li, M.F., McAlister, S.P., Kwong, D.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83430
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Institution: National University of Singapore
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