Characterization of high quality continuous GaN films grown on Si-doped cracked GaN template

Characterization of high quality continuous GaN films grown on Si-doped cracked GaN template

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors: Soh, C.B., Zhang, J., Chi, D.Z., Chua, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83540
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Institution: National University of Singapore
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Summary:Materials Research Society Symposium - Proceedings

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