Characterization of high quality continuous GaN films grown on Si-doped cracked GaN template

Characterization of high quality continuous GaN films grown on Si-doped cracked GaN template

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors:	Soh, C.B., Zhang, J., Chi, D.Z., Chua, S.J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83540
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Institution:	National University of Singapore

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