Erratum: Micro-Raman investigation of strain in GaN and AlxGa1-xN/GaN heterostructures grown on Si(111) (Journal of Applied Physics (2002) 92 (3503))

Journal of Applied Physics

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Bibliographic Details
Main Authors: Tripathy, S., Chua, S.J., Chen, P., Miao, Z.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Others
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/84402
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Institution: National University of Singapore