Identification of deep levels in π-GaN epilayers

Identification of deep levels in π-GaN epilayers

10.1117/12.446547

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Bibliographic Details
Main Authors: Soh, C.B., Chi, D.Z., Lim, H.F., Chua, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
DLTS
GaN
Logarithmic capture kinetic
Transient capacitance
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83813
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/83813

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