DLTS characterisation of InGaAlP films grown using different V/III ratios

DLTS characterisation of InGaAlP films grown using different V/III ratios

10.1016/S1369-8001(02)00031-8

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Bibliographic Details
Main Authors: Lim, H.F., Chi, D.Z., Dong, J.R., Soh, C.B., Chua, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
DLTS
Extended defects
InGaAlP
Logarithmic capture
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83644
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/83644

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