Identification of deep levels in π-GaN epilayers

• Main Authors: Soh, C.B., Chi, D.Z., Lim, H.F., Chua, S.J.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: DLTS; GaN; Logarithmic capture kinetic; Transient capacitance
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/83813
• Institution: National University of Singapore

10.1117/12.446547