Comparative study of trap levels observed in undoped and Si-doped GaN

Materials Research Society Symposium - Proceedings

Saved in:
Bibliographic Details
Main Authors: Soh, C.B., Chi, D.Z., Lim, H.F., Chua, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83563
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore