Comparative study of trap levels observed in undoped and Si-doped GaN

Materials Research Society Symposium - Proceedings

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Main Authors:	Soh, C.B., Chi, D.Z., Lim, H.F., Chua, S.J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83563
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-83563
record_format	dspace
spelling	sg-nus-scholar.10635-835632015-01-09T09:15:35Z Comparative study of trap levels observed in undoped and Si-doped GaN Soh, C.B. Chi, D.Z. Lim, H.F. Chua, S.J. ELECTRICAL & COMPUTER ENGINEERING Materials Research Society Symposium - Proceedings 719 415-420 MRSPD 2014-10-07T04:42:38Z 2014-10-07T04:42:38Z 2002 Conference Paper Soh, C.B.,Chi, D.Z.,Lim, H.F.,Chua, S.J. (2002). Comparative study of trap levels observed in undoped and Si-doped GaN. Materials Research Society Symposium - Proceedings 719 : 415-420. ScholarBank@NUS Repository. 02729172 http://scholarbank.nus.edu.sg/handle/10635/83563 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Materials Research Society Symposium - Proceedings
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Soh, C.B. Chi, D.Z. Lim, H.F. Chua, S.J.
format	Conference or Workshop Item
author	Soh, C.B. Chi, D.Z. Lim, H.F. Chua, S.J.
spellingShingle	Soh, C.B. Chi, D.Z. Lim, H.F. Chua, S.J. Comparative study of trap levels observed in undoped and Si-doped GaN
author_sort	Soh, C.B.
title	Comparative study of trap levels observed in undoped and Si-doped GaN
title_short	Comparative study of trap levels observed in undoped and Si-doped GaN
title_full	Comparative study of trap levels observed in undoped and Si-doped GaN
title_fullStr	Comparative study of trap levels observed in undoped and Si-doped GaN
title_full_unstemmed	Comparative study of trap levels observed in undoped and Si-doped GaN
title_sort	comparative study of trap levels observed in undoped and si-doped gan
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/83563
_version_	1681089458954305536

Comparative study of trap levels observed in undoped and Si-doped GaN

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