Observation of optically-active metastable defects in undoped GaN epilayers

Observation of optically-active metastable defects in undoped GaN epilayers

10.1063/1.121379

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Bibliographic Details
Main Authors: Xu, S.J., Li, G., Chua, S.J., Wang, X.C., Wang, W.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80852
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http://scholarbank.nus.edu.sg/handle/10635/80852

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