Combined DVFS and mapping exploration for lifetime and soft-error susceptibility improvement in MPSoCs

Combined DVFS and mapping exploration for lifetime and soft-error susceptibility improvement in MPSoCs

10.7873/DATE2014.074

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Bibliographic Details
Main Authors: Das, A., Kumar, A., Veeravalli, B., Bolchini, C., Miele, A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83558
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Institution: National University of Singapore
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Summary:10.7873/DATE2014.074

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