Combined DVFS and mapping exploration for lifetime and soft-error susceptibility improvement in MPSoCs
10.7873/DATE2014.074
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Main Authors: | Das, A., Kumar, A., Veeravalli, B., Bolchini, C., Miele, A. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83558 |
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Institution: | National University of Singapore |
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