An efficient soft error protection scheme for MPSoC and FPGA-based verification

As transistor density continues to increase with the advent of nanotechnology, reliability issues raised by more frequently appeared soft errors are becoming critical tasks for future embedded multiprocessor systems design. State-of-the-art techniques for soft error protections targeting multiproces...

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Bibliographic Details
Main Authors: Liu, Weichen, Zhang, Wei, Mao, Fubing
Other Authors: School of Computer Engineering
Format: Article
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/98394
http://hdl.handle.net/10220/12463
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Institution: Nanyang Technological University
Language: English