An efficient soft error protection scheme for MPSoC and FPGA-based verification

As transistor density continues to increase with the advent of nanotechnology, reliability issues raised by more frequently appeared soft errors are becoming critical tasks for future embedded multiprocessor systems design. State-of-the-art techniques for soft error protections targeting multiproces...

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書目詳細資料
Main Authors: Liu, Weichen, Zhang, Wei, Mao, Fubing
其他作者: School of Computer Engineering
格式: Article
語言:English
出版: 2013
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在線閱讀:https://hdl.handle.net/10356/98394
http://hdl.handle.net/10220/12463
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