Stress-induced leakage current in thin oxides under high-field impulse stressing
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-842372015-04-25T18:57:17Z Stress-induced leakage current in thin oxides under high-field impulse stressing Tan, Y.N. Chim, W.K. Lim, P.S. ELECTRICAL & COMPUTER ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 228-233 2014-10-07T04:50:22Z 2014-10-07T04:50:22Z 2001 Conference Paper Tan, Y.N.,Chim, W.K.,Lim, P.S. (2001). Stress-induced leakage current in thin oxides under high-field impulse stressing. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 228-233. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/84237 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
| collection |
ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Tan, Y.N. Chim, W.K. Lim, P.S. |
| format |
Conference or Workshop Item |
| author |
Tan, Y.N. Chim, W.K. Lim, P.S. |
| spellingShingle |
Tan, Y.N. Chim, W.K. Lim, P.S. Stress-induced leakage current in thin oxides under high-field impulse stressing |
| author_sort |
Tan, Y.N. |
| title |
Stress-induced leakage current in thin oxides under high-field impulse stressing |
| title_short |
Stress-induced leakage current in thin oxides under high-field impulse stressing |
| title_full |
Stress-induced leakage current in thin oxides under high-field impulse stressing |
| title_fullStr |
Stress-induced leakage current in thin oxides under high-field impulse stressing |
| title_full_unstemmed |
Stress-induced leakage current in thin oxides under high-field impulse stressing |
| title_sort |
stress-induced leakage current in thin oxides under high-field impulse stressing |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/84237 |
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1681089581725777920 |