The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy
10.1063/1.4818119
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sg-nus-scholar.10635-857762023-10-30T07:45:29Z The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy Du, Y. Kumar, A. Pan, H. Zeng, K. Wang, S. Yang, P. Wee, A.T.S. MECHANICAL ENGINEERING PHYSICS SINGAPORE SYNCHROTRON LIGHT SOURCE 10.1063/1.4818119 AIP Advances 3 8 - 2014-10-07T09:12:01Z 2014-10-07T09:12:01Z 2013 Article Du, Y., Kumar, A., Pan, H., Zeng, K., Wang, S., Yang, P., Wee, A.T.S. (2013). The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy. AIP Advances 3 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4818119 21583226 http://scholarbank.nus.edu.sg/handle/10635/85776 000323845000007 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
| description |
10.1063/1.4818119 |
| author2 |
MECHANICAL ENGINEERING |
| author_facet |
MECHANICAL ENGINEERING Du, Y. Kumar, A. Pan, H. Zeng, K. Wang, S. Yang, P. Wee, A.T.S. |
| format |
Article |
| author |
Du, Y. Kumar, A. Pan, H. Zeng, K. Wang, S. Yang, P. Wee, A.T.S. |
| spellingShingle |
Du, Y. Kumar, A. Pan, H. Zeng, K. Wang, S. Yang, P. Wee, A.T.S. The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy |
| author_sort |
Du, Y. |
| title |
The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy |
| title_short |
The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy |
| title_full |
The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy |
| title_fullStr |
The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy |
| title_full_unstemmed |
The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy |
| title_sort |
resistive switching in tio2 films studied by conductive atomic force microscopy and kelvin probe force microscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/85776 |
| _version_ |
1781784756901380096 |