X-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation
10.1063/1.1631750
Saved in:
Main Authors: | Zhu, T.J., Lu, L. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/85842 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Excimer laser-induced transformation in laser ablated Pb(Zr 0.52Ti 0.48)O 3 amorphous thin films
by: Zhu, T.J., et al.
Published: (2014) -
Electrical properties of Nb-DOPED Pb(Zr0.52Ti 0.48)O3 ceramics
by: Ketsuwan P., et al.
Published: (2014) -
Frequency response and scaling of hysteresis for ferroelectric Pr(Zr0.52Ti0.48)O3 thin films deposited by laser ablation
by: Liu, J.-M., et al.
Published: (2014) -
Growth and properties of (001)-oriented Pb(Zr0.52Ti 0.48)O3/ LaNiO3 films on Si(001) substrates with TiN buffer layers
by: Zhu, T.J., et al.
Published: (2014) -
Pb(Zr0.52Ti0.48)O3/TiNi multilayered heterostructures on Si substrates for smart systems
by: Zhu, T.J., et al.
Published: (2014)