Charge defects-induced electrical properties in bismuth ferrite bilayered thin films
10.1016/j.materresbull.2013.03.042
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2014
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sg-nus-scholar.10635-862102024-11-11T22:12:21Z Charge defects-induced electrical properties in bismuth ferrite bilayered thin films Wu, J. Zhang, B. Wang, X. Wang, J. Zhu, J. Xiao, D. MATERIALS SCIENCE AND ENGINEERING A. Multilayer A. Thin films B. Sputtering D. Electrical properties 10.1016/j.materresbull.2013.03.042 Materials Research Bulletin 48 8 2973-2977 MRBUA 2014-10-07T09:48:01Z 2014-10-07T09:48:01Z 2013-08 Article Wu, J., Zhang, B., Wang, X., Wang, J., Zhu, J., Xiao, D. (2013-08). Charge defects-induced electrical properties in bismuth ferrite bilayered thin films. Materials Research Bulletin 48 (8) : 2973-2977. ScholarBank@NUS Repository. https://doi.org/10.1016/j.materresbull.2013.03.042 00255408 http://scholarbank.nus.edu.sg/handle/10635/86210 000320837300038 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| topic |
A. Multilayer A. Thin films B. Sputtering D. Electrical properties |
| spellingShingle |
A. Multilayer A. Thin films B. Sputtering D. Electrical properties Wu, J. Zhang, B. Wang, X. Wang, J. Zhu, J. Xiao, D. Charge defects-induced electrical properties in bismuth ferrite bilayered thin films |
| description |
10.1016/j.materresbull.2013.03.042 |
| author2 |
MATERIALS SCIENCE AND ENGINEERING |
| author_facet |
MATERIALS SCIENCE AND ENGINEERING Wu, J. Zhang, B. Wang, X. Wang, J. Zhu, J. Xiao, D. |
| format |
Article |
| author |
Wu, J. Zhang, B. Wang, X. Wang, J. Zhu, J. Xiao, D. |
| author_sort |
Wu, J. |
| title |
Charge defects-induced electrical properties in bismuth ferrite bilayered thin films |
| title_short |
Charge defects-induced electrical properties in bismuth ferrite bilayered thin films |
| title_full |
Charge defects-induced electrical properties in bismuth ferrite bilayered thin films |
| title_fullStr |
Charge defects-induced electrical properties in bismuth ferrite bilayered thin films |
| title_full_unstemmed |
Charge defects-induced electrical properties in bismuth ferrite bilayered thin films |
| title_sort |
charge defects-induced electrical properties in bismuth ferrite bilayered thin films |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/86210 |
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1821221205640740864 |