Charge defects-induced electrical properties in bismuth ferrite bilayered thin films

Charge defects-induced electrical properties in bismuth ferrite bilayered thin films

10.1016/j.materresbull.2013.03.042

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Bibliographic Details
Main Authors: Wu, J., Zhang, B., Wang, X., Wang, J., Zhu, J., Xiao, D.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: 2014
Subjects:
A. Multilayer
A. Thin films
B. Sputtering
D. Electrical properties
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86210
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Institution: National University of Singapore

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