Crystallization-induced stress in thin phase change films of different thicknesses

Crystallization-induced stress in thin phase change films of different thicknesses

10.1063/1.3040314

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Bibliographic Details
Main Authors: Guo, Q., Li, M., Li, Y., Shi, L., Chong, T.C., Kalb, J.A., Thompson, C.V.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86244
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/86244

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