Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films
10.1063/1.2185838
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2014
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sg-nus-scholar.10635-868092023-10-26T08:05:48Z Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films Gao, X.S. Wang, J. MATERIALS SCIENCE AND ENGINEERING 10.1063/1.2185838 Journal of Applied Physics 99 7 - JAPIA 2014-10-07T09:55:03Z 2014-10-07T09:55:03Z 2006-04 Article Gao, X.S., Wang, J. (2006-04). Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films. Journal of Applied Physics 99 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2185838 00218979 http://scholarbank.nus.edu.sg/handle/10635/86809 000236770900045 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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| description |
10.1063/1.2185838 |
| author2 |
MATERIALS SCIENCE AND ENGINEERING |
| author_facet |
MATERIALS SCIENCE AND ENGINEERING Gao, X.S. Wang, J. |
| format |
Article |
| author |
Gao, X.S. Wang, J. |
| spellingShingle |
Gao, X.S. Wang, J. Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films |
| author_sort |
Gao, X.S. |
| title |
Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films |
| title_short |
Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films |
| title_full |
Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films |
| title_fullStr |
Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films |
| title_full_unstemmed |
Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films |
| title_sort |
thickness dependences of ferroelectric and dielectric properties in (bi3.15nd0.85)ti3o12 thin films |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/86809 |
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1781784954806468608 |