SPC of a near zero-defect process subject to random shocks

Quality and Reliability Engineering International

Saved in:
Bibliographic Details
Main Authors: Xie, M., Goh, T.N.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/87260
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:Quality and Reliability Engineering International