SPC of a near zero-defect process subject to random shocks
Quality and Reliability Engineering International
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sg-nus-scholar.10635-872602015-05-19T11:20:27Z SPC of a near zero-defect process subject to random shocks Xie, M. Goh, T.N. INDUSTRIAL & SYSTEMS ENGINEERING Quality and Reliability Engineering International 9 2 89-93 QREIE 2014-10-07T10:26:07Z 2014-10-07T10:26:07Z 1993-03 Article Xie, M.,Goh, T.N. (1993-03). SPC of a near zero-defect process subject to random shocks. Quality and Reliability Engineering International 9 (2) : 89-93. ScholarBank@NUS Repository. 07488017 http://scholarbank.nus.edu.sg/handle/10635/87260 NOT_IN_WOS Scopus |
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Quality and Reliability Engineering International |
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INDUSTRIAL & SYSTEMS ENGINEERING |
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INDUSTRIAL & SYSTEMS ENGINEERING Xie, M. Goh, T.N. |
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Xie, M. Goh, T.N. |
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Xie, M. Goh, T.N. SPC of a near zero-defect process subject to random shocks |
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Xie, M. |
title |
SPC of a near zero-defect process subject to random shocks |
title_short |
SPC of a near zero-defect process subject to random shocks |
title_full |
SPC of a near zero-defect process subject to random shocks |
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SPC of a near zero-defect process subject to random shocks |
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SPC of a near zero-defect process subject to random shocks |
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spc of a near zero-defect process subject to random shocks |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/87260 |
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