On measurement systems in the IC assembly industry
IEEE International Engineering Management Conference
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sg-nus-scholar.10635-873552015-02-06T09:43:27Z On measurement systems in the IC assembly industry Lai, Y.W. Duan, C.M. Chew, E.P. INDUSTRIAL & SYSTEMS ENGINEERING IEEE International Engineering Management Conference 412-417 IEMCF 2014-10-07T10:27:11Z 2014-10-07T10:27:11Z 1995 Conference Paper Lai, Y.W.,Duan, C.M.,Chew, E.P. (1995). On measurement systems in the IC assembly industry. IEEE International Engineering Management Conference : 412-417. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/87355 NOT_IN_WOS Scopus |
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IEEE International Engineering Management Conference |
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INDUSTRIAL & SYSTEMS ENGINEERING |
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INDUSTRIAL & SYSTEMS ENGINEERING Lai, Y.W. Duan, C.M. Chew, E.P. |
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Conference or Workshop Item |
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Lai, Y.W. Duan, C.M. Chew, E.P. |
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Lai, Y.W. Duan, C.M. Chew, E.P. On measurement systems in the IC assembly industry |
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Lai, Y.W. |
title |
On measurement systems in the IC assembly industry |
title_short |
On measurement systems in the IC assembly industry |
title_full |
On measurement systems in the IC assembly industry |
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On measurement systems in the IC assembly industry |
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On measurement systems in the IC assembly industry |
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on measurement systems in the ic assembly industry |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/87355 |
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