On measurement systems in the IC assembly industry

IEEE International Engineering Management Conference

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Bibliographic Details
Main Authors: Lai, Y.W., Duan, C.M., Chew, E.P.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/87355
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-873552015-02-06T09:43:27Z On measurement systems in the IC assembly industry Lai, Y.W. Duan, C.M. Chew, E.P. INDUSTRIAL & SYSTEMS ENGINEERING IEEE International Engineering Management Conference 412-417 IEMCF 2014-10-07T10:27:11Z 2014-10-07T10:27:11Z 1995 Conference Paper Lai, Y.W.,Duan, C.M.,Chew, E.P. (1995). On measurement systems in the IC assembly industry. IEEE International Engineering Management Conference : 412-417. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/87355 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description IEEE International Engineering Management Conference
author2 INDUSTRIAL & SYSTEMS ENGINEERING
author_facet INDUSTRIAL & SYSTEMS ENGINEERING
Lai, Y.W.
Duan, C.M.
Chew, E.P.
format Conference or Workshop Item
author Lai, Y.W.
Duan, C.M.
Chew, E.P.
spellingShingle Lai, Y.W.
Duan, C.M.
Chew, E.P.
On measurement systems in the IC assembly industry
author_sort Lai, Y.W.
title On measurement systems in the IC assembly industry
title_short On measurement systems in the IC assembly industry
title_full On measurement systems in the IC assembly industry
title_fullStr On measurement systems in the IC assembly industry
title_full_unstemmed On measurement systems in the IC assembly industry
title_sort on measurement systems in the ic assembly industry
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/87355
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