On measurement systems in the IC assembly industry

• Main Authors: Lai, Y.W., Duan, C.M., Chew, E.P.
• Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/87355
• Institution: National University of Singapore

IEEE International Engineering Management Conference