Planning of step-stress accelerated degradation test

• Main Authors: Tang, L.C., Yang, G.Y., Xie, M.
• Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Accelerated testing; Degradation; Highly reliable product; Optimal plan; Reliability estimation
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/87377
• Institution: National University of Singapore

Proceedings of the Annual Reliability and Maintainability Symposium