Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

• Main Authors: Kwek, J.W., Vakarelski, I.U., Ng, W.K., Heng, J.Y.Y., Tan, R.B.H.
• 其他作者: CHEMICAL & BIOMOLECULAR ENGINEERING
• 格式: Article
• 出版: 2014
• 主題: Atomic force microscope; Electrostatic forces; Microparticles
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/89611

10.1016/j.colsurfa.2011.06.008