Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

10.1016/j.colsurfa.2011.06.008

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Bibliographic Details
Main Authors: Kwek, J.W., Vakarelski, I.U., Ng, W.K., Heng, J.Y.Y., Tan, R.B.H.
Other Authors: CHEMICAL & BIOMOLECULAR ENGINEERING
Format: Article
Published: 2014
Subjects:
Atomic force microscope
Electrostatic forces
Microparticles
Online Access:http://scholarbank.nus.edu.sg/handle/10635/89611
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Institution: National University of Singapore

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