Characterization of atomic force microscopy (AFM) tip shapes by scanning hydrothermally deposited ZnO thin films

Characterization of atomic force microscopy (AFM) tip shapes by scanning hydrothermally deposited ZnO thin films

10.1016/S0039-9140(97)00294-4

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Bibliographic Details
Main Authors: Bao, G.W., Li, S.F.Y.
Other Authors: CHEMISTRY
Format: Conference or Workshop Item
Published: 2014
Subjects:
Atomic force microscopy
Tip shapes
ZnO thin films
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95443
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Institution: National University of Singapore
Description
Summary:10.1016/S0039-9140(97)00294-4

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